| Material | Au | Solder | Cu | Ni | Electroless Ni/Au |
Function | ||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| - | +SnAg | +Ni +SnAg |
+Ni +Au |
- | +SnAg | |||||||
| Form | PLATE | STUD | PLATE | MOUNT | PLATE | PLATE | PLATE | PLATE | PLATE | PLATE | PLATE | --- |
| Image | --- | |||||||||||
| MB50 | ● | ● | ● | - | ● | ● | ● | ● | ● | ● | - | Daisy |
| MB60 | ● | ● | ● | - | ● | ● | ● | ● | ● | ● | - | Daisy |
| MB80 | ● | ● | ● | - | ● | ● | ● | ● | ● | ● | - | Daisy |
| MB130 | ● | ● | ● | - | ● | ● | ● | ● | ● | ● | ● | Daisy |
| CC40 | ● | - | ● | - | ● | ● | ● | ● | ● | ● | - | Daisy |
| IP40 | - | - | - | - | ● | ● | ● | ● | ● | ● | ● | Daisy/Vernier Bump Short/ Breakdown Voltage |
| IP40A | - | - | - | - | ● | ● | - | - | - | - | ● | |
| CC80 | ● | ● | ● | - | ● | ● | ● | ● | ● | ● | - | Daisy |
| IP80 | - | - | - | - | ● | ● | ● | ● | ● | ● | ● | Daisy |
| CC80TSV | - | - | - | - | - | ● | ● | - | - | - | ●/◎ | TSV |
| CC80MarkⅡ | ● | ● | ● | - | ● | ● | ● | ● | ● | ● | - | Daisy/Migration |
| CC80MarkⅡWM | - | - | - | - | ● | ● | - | - | - | - | ◎ | Daisy/Migration |
| WM40-0101 | - | - | - | - | ◎ | ● | - | - | - | - | - | --- |
| CC80MarkⅢ | - | - | - | - | ● | ● | - | - | - | - | ◎ | Daisy/Migration |
| WM40-0102 | - | - | - | - | - | ● | - | - | - | - | - | Daisy |
| CC80MarkⅣ | - | - | - | - | ● | ● | - | - | - | - | - | Daisy |
| IP80MarkⅣ | - | - | - | - | - | - | - | - | - | - | ● | Daisy |
| FC150LC | - | - | - | - | ● | ● | - | - | - | - | - | Daisy |
| FC150(Si) | - | - | ● | ● | ● | ● | ● | ● | ● | ● | ● | Daisy |
| FC150(Glass) | - | - | ● | ● | ● | ● | ● | ● | ● | ● | ● | --- |
| FC150SC | - | - | ● | ● | ● | ● | ● | ● | ● | ● | ● | Daisy |
| FC200(Si) |
- | - | ● | ● | ● | ● | ● | ● | ● | ● | ● | Daisy |
| FC200(Glass) | - | - | ● | ● | ● | ● | ● | ● | ● | ● | ● | --- |
| FC200SC | - | - | ● | ● | ● | ● | ● | ● | ● | ● | ● | Daisy |
| FC500G | - | - | - | - | ● | ● | - | - | - | - | - | --- |
| FBW | - | - | - | - | ● | ● | ● | - | - | - | - | --- |
| WLP | - | - | - | ● | - | - | - | - | - | - | - | Daisy |
| MC03 | ● | - | - | - | ● | ● | - | - | - | - | - | Daisy |
| ME | - | - | - | - | - | - | - | - | - | - | - | Migration |
| STAC | ● | ● | ● | - | ● | ● | ● | ● | ● | ● | - | Stress/ Thermal/ HeatGeneration |
| STAC150FA | - | - | - | - | ● | ● | ● | ● | ● | ● | - | |
| STAC300FA | - | - | - | - | ● | ● | ● | ● | ● | ● | - | |
| HPW | ● | ● | ● | - | ● | ● | ● | ● | ● | ● | - | Thermal/ Heat Generation |
| HPW150FA | - | - | - | - | ● | ● | ● | ● | ● | ● | - | |
| HPW300FA | - | - | - | - | ● | ● | ● | ● | ● | ● | - | |
| HPWTSV | - | - | - | - | - | ● | - | - | - | - | ◎ | TSV |
| LCD30 | ● | - | ● | - | ● | ● | ● | ● | ● | ● | ● | Daisy/ Breakdown Voltage |
| PWB | - | - | - | - | - | - | - | - | - | - | - | Bondability |
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Cu Pillar Bump TEG |
Solder Bump TEG |
Electroless Plating Bump TEG |
| Specification | Type-A | Type-B | Type-C (Glass) |
|---|---|---|---|
| Wafer Size | φ 8 inch | φ 8 inch | φ 8 inch |
| Wafer Thickness | 725±25μm | 725±25μm | 700±70μm |
| Chip Size | 7.3mm■ | 7.3mm■ | 7.3mm■ |
| Pad Pitch | 50μm | 50μm | 50μm |
| Function | Daisy Chian | Daisy Chian | - |
| Bump Size | - | Au: 30µm■ Cu: 30µm■ Cu: φ25μm● |
Cu: 30µm■ Cu: φ25μm● |
| Bump Height | - | (Cu30μm+SnAg15µm) | (Cu30μm+SnAg15μm) |
| Number of Pad | 544 pads/chip | 544 pads/chip | - |
| Number of Chip | 478 chips/wafer | 478 chips/wafer | 478 chips/wafer |
| Polyimide (Option) | ○ | ○ | ○ |
| Evaluation KIT | WALTS-KIT MB50-0102JY_NCR【Standard】 WALTS-KIT MB50-0104JY_CR【Standard】 WALTS-KIT MB50-0105JY_CR【Standard】 WALTS-KIT MB50-0102JY_NCR【MAP】 WALTS-KIT MB50-0103JY_CR【MAP】 WALTS-KIT MB50-0104JY_CR【MAP】 |
||
| Specification | MB60-0101JY |
|---|---|
| Wafer Size | φ 8 inch |
| Wafer Thickness | 725±25μm |
| Chip Size | 7.3mm■ |
| Pad Pitch | 60μm |
| Function | Daisy Chian |
| Bump Size | - |
| Bump Height | - |
| Number of Pad | 448 pads/chip |
| Number of Chip | 478 chips/wafer |
| Polyimide (Option) | ○ |
| Evaluation KIT | --- |
| Specification | TYPE-A | TYPE-B |
|---|---|---|
| Wafer Size | φ 8 inch | φ 8 inch |
| Wafer Thickness | 725±25μm | 725±25μm |
| Chip Size | 7.3mm■ | 7.3mm■ |
| Pad Pitch | 80μm Staggerd | 80μm Staggerd |
| Function | Daisy Chian | Daisy Chian |
| Bump Size | - | 38μm■ |
| Bump Height | (Wire Bonding) | (Cu30μm+SnAg15μm) |
| Number of Pad | 648 pads/chip 82 pads × 4 (Outer Line) 80 pads × 4 (Innter Line) |
648 pads/chip 82 pads × 4 (Outer Line) 80 pads × 4 (Innter Line) |
| Number of Chip | 478 chips/wafer | 478 chips/wafer |
| Polyimide (Option) | ○ | ○ |
| Evaluation KIT | WALTS-KIT CC80-0104JY (ModelⅣ) |
|
| Specification | AS8R |
|---|---|
| Wafer Size | φ 8 inch |
| Wafer Thickness | 725±25μm |
| Chip Size | 3.5 mm■ |
| Pad Pitch | 120μm |
| Function | Daisy Chian |
| Bump Size | - |
| Bump Height | - |
| Number of Pad | 96 pads/chip (Outer Line) 88 pads/chip (Inner Line) |
| Number of Chip | 2266 chips/wafer |
| Polyimide (Option) | ○ |
| Evaluation KIT | --- |
| Specification | MB130 | MB130A | |
|---|---|---|---|
| TYPE-A | TYPE-B | ||
| Wafer Size | φ 6 inch | φ 6 inch | φ 8 inch |
| Wafer Thickness | 550±25μm | 550±25μm | 725±25μm |
| Chip Size | 2.13 mm■ | 2.13 mm■ | 2.13 mm■ |
| Pad Pitch | 130μm | 130μm | 130μm |
| Function | Daisy Chian | Daisy Chian | Daisy Chian |
| Bump Size | - | 70µm■ | - |
| Bump Height | (Wire Bonding) (Au Stud Bump) |
(Cu30μm+SnAg15μm) | (Wire Bonding) (Au Stud Bump) |
| Number of Pad | 108 pad/chip 15 pads× 4 (outer Line) 12 pads× 4 (Inner Line) |
108 pad/chip 15 pads× 4 (outer Line) 12 pads× 4 (Inner Line) |
108 pad/chip 15 pads× 4 (outer Line) 12 pads× 4 (Inner Line) |
| Number of Chip | 3300 chips/wafer | 3300 chips/wafer | 6060 chips/wafer |
| Polyimide (Option) | ○ | ○ | ○ |
| Evaluation KIT | --- |
--- | |
| Specification | MB6020-0102JY |
|---|---|
| Wafer Size | φ 8 inch |
| Wafer Thickness | 725±25μm |
| Chip Size | 3.0 mm■ |
| Pad Pitch | 60 / 55 / 50 / 45 / 40 / 35 / 30 / 25 / 20 μm |
| Function | Daisy Chian |
| Bump Size | - |
| Bump Height | - |
| Number of Pad | (40×4) (40×4) (38×4) (38×4) (36×4) (34×4) (30×4) (26×4) (18×4) |
| Number of Chip | 3016 chips/wafer |
| Polyimide (Option) | --- |
| Evaluation KIT | --- |
| Specification | CC40-0101JY |
|---|---|
| Wafer Size | φ 8 inch |
| Wafer Thickness | 725±25μm |
| Chip Size | 7.3 mm■ |
| Pad Pitch | Model Ⅰ: 40μm Staggered + 40μm Full Area Model Ⅱ: 40μm Staggered |
| Function | Daisy Chian |
| Bump Size | Model Ⅰ: 22μm● Model Ⅱ: 22μm● |
| Bump Height | (Cu15μm+SnAg10μm) |
| Number of Pad | Model Ⅰ: 29576 pads/chip Model Ⅱ: 1352 pads/chip |
| Number of Chip | 478 chips/wafer |
| Polyimide (Option) | --- |
| Evaluation KIT | WALTS-TEG IP40-0101JY (Silicon Interposer) WALTS-TEG IP40A-0101JY (Silicon Interposer) |
| Specification | IP40-0101JY(ModelⅠ / ModelⅡ) |
|---|---|
| Wafer Size | φ 8 inch |
| Wafer Thickness | 725±25μm |
| Chip Size | 10.0 mm■ |
| Pad Pitch | (1) 40μm pitch Full area + Staggered (Model Ⅰ) 40μm pitch Staggered (Model Ⅱ) (2) 250μm pitch Periphera (Outer Pad) |
| Function | Daisy Chian Bump Short Check Vernier Breakdown Voltage Check between the Bumps |
| Bump Size | --- |
| Bump Height | --- |
| Number of Pad | Model Ⅰ:(1) 29576 pads/chip (2) 124 pads/chip (Outer Pad) Model Ⅱ:(1) 1352 pads/chip (2) 124 pads/chip (Outer Pad) |
| Number of Chip | 228 chips/wafer |
| Polyimide (Option) | --- |
| Evaluation KIT | --- |
| Specification | IP40A-0101JY(ModelⅠ) |
|---|---|
| Wafer Size | φ 12 inch |
| Wafer Thickness | 775±25μm |
| Chip Size | 10.0 mm■ |
| Pad Pitch | (1) 40μm pitch Full area + Staggered (ModelⅠ) (2) 250μm pitch Periphera (Outer Pad) |
| Function | Daisy Chian Bump Short Check Vernier Breakdown Voltage Check between the Bumps |
| Bump Size | --- |
| Bump Height | --- |
| Number of Pad | Model Ⅰ:(1) 29576 pads/chip (2) 124 pads/chip (Outer Pad) |
| Number of Chip | 616 chips/wafer |
| Polyimide (Option) | --- |
| Evaluation KIT | --- |

| Specification | CC80-0101JY |
|---|---|
| Wafer Size | φ 8 inch |
| Wafer Thickness | 725±25μm |
| Chip Size | 7.3 mm■ |
| Pad Pitch | 80μm Staggered (Periphera) 300μm Full Area (Center Core) |
| Function | Daisy Chian |
| Bump Size | Model Ⅰ: 38µm■ or φ42μm● Model Ⅱ: 38µm■ Model Ⅲ: 38µm■ Model Ⅳ: 38µm■ |
| Bump Height | (Cu30μm+SnAg15μm) |
| Number of Pad | Model Ⅰ: 1048 pads/chip Model Ⅱ: 904 pads/chip Model Ⅲ: 728 pads/chip Model Ⅳ: 648 pads/chip |
| Number of Chip | 478 chips/wafer |
| Polyimide (Option) | ○ |
| Evaluation KIT | WALTS-TEG IP80-STG0101JY (Silicon Interposer) WALTS-KIT CC80-0104JY |
| Specification | IP80-0101JY |
|---|---|
| Wafer Size | φ 8 inch |
| Wafer Thickness | 725±25μm |
| Chip Size | 10.0 mm■ |
| Pad Pitch | (1) 80μm Staggered (Inner Pad) (2) 300μm Full Area (Center Core) (3) 250μm Periphera (Outer Pad) |
| Function | Daisy Chian |
| Bump Size | - |
| Bump Height | - |
| Number of Pad | (1) 648 pads/chip (2) 400 pads/chip (3) 124 pads/chip |
| Number of Chip | 228 chips/wafer |
| Polyimide (Option) | ○ |
| Evaluation KIT | --- |
| Specification | CC80TSV-1 | CC80TSV-2 | |
|---|---|---|---|
| Wafer Size | φ 8 inch | φ 8 inch | |
| Chip Thickness | 100μm | 100μm | |
| Chip Size | 7.3 mm■ | 7.3 mm■ | |
| Pad Pitch | 80μm Staggered (Periphera) 300μm Full Area (Center Core) |
80μm Staggered (Periphera) 300μm Full Area (Center Core) |
|
| TSV Hole Diameter | φ40µm● | φ40µm● | |
| Top Side |
Electrode | Electroless Ni/Au | Cu+SnAg |
| Bump Size | φ48μm●(Option: φ42μm●) | 38μm■ (Option: φ42μm●) | |
| Bump Height | (8~12µm) | (Cu20μm+SnAg15μm) | |
| Bottom Side |
Electrode | Electroless Ni/Au | Electroless Ni/Au |
| Bump Size | φ48μm●(Option: φ42μm●) | φ48μm●(Option: φ42μm●) | |
| Bump Height | (8~12µm) | (8~12µm) | |
| Number of Chip | 478 chips/wafer | 478 chips/wafer | |
| Evaluation KIT | WALTS-TEG CC80-0101JY WALTS-TEG IP80-0101JY (Silicon Interposer) |
||
| Specification | CC80MarkⅡ-0101JY【STD】 |
|---|---|
| Wafer Size | φ 8 inch |
| Wafer Thickness | 725±25μm |
| Chip Size | 12.0 mm■ |
| Pad Pitch | 80μm Staggered (Periphera) 200μm Full Area (Center Core) |
| Function | Daisy Chain & Migration |
| Bump Size | φ31μm● |
| Bump Height | (Cu30μm+SnAg15μm) |
| Number of Pad | 1660 pads/chip (Periphera) 2916 pads/chip (Center Core) |
| Number of Chip | 177 chips/wafer |
| Polyimide (Option) | --- |
| Evaluation KIT | WALTS-KIT CC80MarkⅡ-0201JY |
| Specification | CC80MarkII WM-0101JY ※Base Wafer:WALTS TEG CC80MarkII-0101JY |
||
|---|---|---|---|
| Wafer Size | 8inch | ||
| Wafer Thickness | 100μm | ||
| Chip Size | 10 mm × 8 mm | ||
| Function | Daisy Chain & Migration(Top Side) | ||
| Top Side |
Electrode | Cu Pillar | |
| Bump Size | φ31μm● | ||
| Bump Height | (Cu 20μm + SnAg 15μm) | ||
| Bottom Side |
Electrode | Cu Post | |
| Bump Size | φ26μm● | ||
| Bump Pitch | ① 40μm | ②300μm | |
| Number of Bump | ①1200 bumps | ② 714 bumps | |
| Bump Height | (Cu 6μm) | ||
| Number of Chip | 177 chips/wafer | ||
| Evaluation KIT | WALTS-KIT CC80MarkII-0201JY WALTS-TEG WM40-0101JY |
||
| Specification | WM40-0101JY | ||
|---|---|---|---|
| Wafer Size | 8inch | ||
| Wafer Thickness | 50μm | ||
| Chip Size | 10 mm × 8 mm | ||
| Function | --- | ||
| Top Side |
Electrode | Cu Pillar | |
| Bump Size | φ20μm● | ||
| Bump Height | (Cu15μm + SnAg8μm) | ||
| Bump Pitch | ① 40μm | ②300μm | |
| Number of Bump | ①1200 bumps | ② 714 bumps | |
| Bottom Side |
Electrode | Cu Post | |
| Bump Size | φ26μm● | ||
| Bump Height | (Cu 6μm) | ||
| Bump Pitch | ① 40μm | ②300μm | |
| Number of Bump | ①1200 bumps | ② 714 bumps | |
| Number of Chip | 312 chips/wafer | ||
| Evaluation KIT | WALTS-KIT CC80MarkII-0201JY | ||
| Specification | CC80MarkⅢ-0101JY | |||
|---|---|---|---|---|
| Wafer Size | 6inch | |||
| Wafer Thickness | 100μm or 350μm | |||
| Chip Size | 12.0 mm × 12.0 mm | |||
| Function | Daisy Chain & Migration(Top Side) Daisy Chain (Bottom Side) |
|||
| Top Side |
Electrode | Cu Pillar | ||
| Bump Size | φ31μm● | |||
| Pad Pitch | ① 80μm Three Rows Staggered (Peripheral) ② 200μm Full Area(Center Core) |
|||
| Number of Bump/Pad | ① 1660bumps/1660pads (Peripheral) ② 2916bumps/2916pads(Center Core) |
|||
| Bottom Side |
Electrode | Electroless Ni/Au | ||
| Bump Size | φ20μm● | |||
| Bump Pitch | ① 40μm (Center Core) ② 300μm (Peripheral) ③ 550μm (Outer Pad) |
|||
| Number of Bump | ① 120 pads (Center Core) ② 714 pads (Peripheral) ③ 40 pads (Outer Pad) |
|||
| Number of Chip | 89 chips/wafer | |||
| Evaluation KIT | WALTS-KIT CC80MarkII-0201JY WALTS-TEG WM40-0102JY |
|||
| Specification | WM40-0102JY | ||
|---|---|---|---|
| Wafer Size | 8inch | ||
| Wafer Thickness | 725±25μm |
||
| Chip Size | 10 mm × 8 mm | ||
| Function | Daisy Chain | ||
| Electrode | Cu Pillar | ||
| Bump Size | φ20μm● | ||
| Bump Height | (Cu15μm + SnAg8μm) | ||
| Bump Pitch | ① 40μm | ②300μm | |
| Number of Bump | ①1200 bumps | ② 714 bumps | |
| Number of Chip | 312 chips/wafer | ||
| Evaluation KIT | WALTS-KIT CC80MarkII-0201JY | ||
| Specification | CC80MarkIV-0101JY | ||
|---|---|---|---|
| Wafer Size | 8inch | ||
| Wafer Thickness | 725±25μm |
||
| Chip | Chip A | Chip B | |
| Chip Size | 6.0 mm × 10.0 mm | 4.0 mm × 10.0 mm | |
| Pad Pitch |
① 40μm[10Row]×50μm[192Row] (Peripheral) |
||
| Function | Daisy Chain | ||
| Electrode | Cu Pillar | ||
| Bump Size | φ25μm● | ||
| Number of Bump/Pad | ①1920bumps/1920pads ② 687 bumps/ 687 pads ③1743bumps/1743pads |
①1920bumps/1920pads ② 531 bumps/ 531 pads ③ 978 bumps/ 978 pads |
|
| Number of Chip | Chip A:228chips/wafer Chip B:228chips/wafer | ||
| Evaluation KIT | WALTS-TEG IP80MarkIV-0101JY (Sillicon Interposer) | ||
| Specification | IP80MarkIV-0101JY | ||
|---|---|---|---|
| Wafer Size | 8inch | ||
| Wafer Thickness | 725±25μm |
||
| Chip Size | 15.0 mm × 15.0 mm | ||
| Pad Pitch |
① 40μm[10Row]×50μm[192Row]×2 (Peripheral) |
||
| Function | Daisy Chain | ||
| Electrode | Electroless Ni/Au plating |
||
| Bump Size | ①27μm● ②27μm● ③27μm● ④141μm■ |
||
| Number of Bump/Pad | ①3840bumps/3840pads ②1172bumps/1172pads ③2721bumps/2721pads ④328bumps/328pads |
||
| Number of Chip | 97 chips/wafer | ||
| Evaluation KIT | --- |
| Specification | FC150LC-0101JY |
|---|---|
| Wafer Size | φ 12 inch |
| Wafer Thickness | 775±25μm |
| Chip Size | 25.0mm■ |
| Pad Pitch | 150 μm (Area) |
| Function | Daisy Chian |
| Bump Size | φ75µm● |
| Bump Height | Cu pillar (Cu30µm+SnAg15µm) |
| Number of Pad | 25921 pads/chip (161×161) |
| Number of Chip | 89 chips/wafer |
| Polyimide (Option) | ○ |
| Evaluation KIT | WALTS-KIT FC150LC-0302JY |
| Specification | Type-A | Type-B |
|---|---|---|
| Wafer Size | φ 8 inch | φ 8 inch |
| Wafer Thickness | 725±25μm | 725±25μm |
| Chip Size | 10.0mm■ | 10.0mm■ |
| Pad Pitch | 150 μm (Area) | 150 μm (Area) |
| Function | Daisy Chian | Daisy Chian |
| Bump Size | φ85µm● | φ75µm● |
| Bump Height | Ball Mounted Solder Bump (80µm) | Cu Pillar (Cu30μm+SnAg15μm) |
| Number of Pad | 3721 pads/chip (61×61) | 3721 pads/chip (61×61) |
| Number of Chip | 208 chips/wafer | 208 chips/wafer |
| Polyimide (Option) | ○ | ○ |
| Evaluation KIT | WALTS-KIT 01A150P-10-2 WALTS-KIT FC150-0103JY 2×2 WALTS-KIT FC150-0104JY 2×2 WALTS-KIT FC150R-0102JY 2×2 |
|
| Specification | Type-A | Type-B |
|---|---|---|
| Wafer Size | φ 8 inch | φ 8 inch |
| Wafer Thickness | 700±70μm | 700±70μm |
| Chip Size | 10.0mm■ | 10.0mm■ |
| Pad Pitch | 150 μm (Area) | 150 μm (Area) |
| Function | - | - |
| Bump Size | φ85µm● | φ75µm● |
| Bump Height | Ball Mounted Solder Bump (80µm) | Cu Pillar (Cu30μm+SnAg15μm) |
| Number of Pad | 3721 pads/chip (61×61) | 3721 pads/chip (61×61) |
| Number of Chip | 228 chips/wafer | 228 chips/wafer |
| Polyimide (Option) | 208 chips/wafer | 208 chips/wafer |
| Evaluation KIT | WALTS-KIT 01A150P-10-2 WALTS-KIT FC150-0103JY 2×2 WALTS-KIT FC150-0104JY 2×2 WALTS-KIT FC150R-0102JY 2×2 |
|
| Specification | Type-A | Type-B |
|---|---|---|
| Wafer Size | φ 8 inch | φ 8 inch |
| Wafer Thickness | 725±25μm | 725±25μm |
| Chip Size | 5.02mm■ | 5.02mm■ |
| Pad Pitch | 150 μm (Area) | 150 μm (Area) |
| Function | Daisy Chian | Daisy Chian |
| Bump Size | φ85µm● | φ75µm● |
| Bump Height | Ball Mounted Solder Bump (80µm) | Cu Pillar (Cu30μm+SnAg15μm) |
| Number of Pad | 784 pads/chip (28×28) | 784 pads/chip (28×28) |
| Number of Chip | 832 chips/wafer | 832 chips/wafer |
| Polyimide (Option) | ○ | ○ |
| Evaluation KIT | --- | |
| Specification | Type-A | Type-B |
|---|---|---|
| Wafer Size | φ 8 inch | φ 8 inch |
| Wafer Thickness | 725±25μm | 725±25μm |
| Chip Size | 10.0mm■ | 10.0mm■ |
| Pad Pitch | 200μm (Area) | 200μm (Area) |
| Function | Daisy Chian | Daisy Chian |
| Bump Size | φ100µm● | φ90µm● |
| Bump Height | Ball Mounted Solder Bump (80µm) | Cu Pillar (Cu30μm+SnAg15μm) |
| Number of Pad | 2116 pads/chip (46×46) | 2116 pads/chip (46×46) |
| Number of Chip | 228 chips/wafer | 228 chips/wafer |
| Polyimide (Option) | ○ | ○ |
| Evaluation KIT | WALTS-KIT 01A200P-10 WALTS-KIT 01A200P-10_C400 WALTS-KIT FC200-0101JY 2×2 WALTS-KIT FC200-0102JY 2×2 |
|
| Specification | Type-A | Type-B |
|---|---|---|
| Wafer Size | φ 8 inch | φ 8 inch |
| Wafer Thickness | 700±70μm | 700±70μm |
| Chip Size | 10.0mm■ | 10.0mm■ |
| Pad Pitch | 200μm (Area) | 200μm (Area) |
| Function | - | - |
| Bump Size | φ100µm● | φ90µm● |
| Bump Height | Ball Mounted Solder Bump (80µm) | Cu Pillar (Cu30μm+SnAg15μm) |
| Number of Pad | 2116 pads/chip (46×46) | 2116 pads/chip (46×46) |
| Number of Chip | 228 chips/wafer | 228 chips/wafer |
| Polyimide (Option) | ○ | ○ |
| Evaluation KIT | WALTS-KIT 01A200P-10 WALTS-KIT 01A200P-10_C400 WALTS-KIT FC200-0101JY 2×2 WALTS-KIT FC200-0102JY 2×2 |
|
| Specification | Type-A | Type-B |
|---|---|---|
| Wafer Size | φ 8 inch | φ 8 inch |
| Wafer Thickness | 725±25μm | 725±25μm |
| Chip Size | 5.02mm■ | 5.02mm■ |
| Pad Pitch | 200μm (Area) | 200μm (Area) |
| Function | Daisy Chian | Daisy Chian |
| Bump Size | φ100µm● | φ90µm● |
| Bump Height | Ball Mounted Solder Bump (80µm) | Cu Pillar (Cu30μm+SnAg15μm) |
| Number of Pad | 484 pads/chip (22×22) | 484 pads/chip (22×22) |
| Number of Chip | 832 chips/wafer | 832 chips/wafer |
| Polyimide (Option) | ○ | ○ |
| Evaluation KIT | WALTS-KIT FC200SC-0202JY 2×3 WALTS-KIT FC200SC-0202JY 3×3 |
|
| Specification | WALTS-TEG FC500G-0101JY【Glass Type】 | |
|---|---|---|
| Wafer Size | φ 8 inch | |
| Wafer Thickness | 700±70μm | |
| Chip Size | 10.1mm■ | |
| Pad Pitch | 500 μm | |
| Function | - | |
| Bump Size | φ100µm● | |
| Bump Height | (Cu30μm+SnAg15μm) | |
| Number of Pad | 40 pads/chip | |
| Number of Chip | 240 chips/wafer | |
| Evaluation KIT | --- | |
| Specification | FBW200 | FBW150 | FBW130 | FBW100 | FBW80 |
|---|---|---|---|---|---|
| Wafer Size | φ 8 inch | φ 8 inch | φ 8 inch | φ 8 inch | φ 8 inch |
| Wafer Thickness | 725±25μm | 725±25μm | 725±25μm | 725±25μm | 725±25μm |
| Bump Pitch | 200μm | 150μm | 130μm | 100μm | 80μm |
| Electrode | Cu Pillar | Cu Pillar | Cu Pillar | Cu Pillar | Cu Pillar |
| Bump Size | φ90μm | φ75μm | φ65μm | φ50μm | φ40μm |
| Bump Height | (Max.60μm) | (Max.60μm) | (Max.60μm) | (Max.60μm) | (Max.50μm) |
| Specification | 0.4mm pitch BGA | 0.3mm pitch BGA |
|---|---|---|
| Wafer Size | φ 8 inch | φ 8 inch |
| Wafer Thickness | 400±20μm | 400±20μm |
| Chip Size | 6.0mm■ | 6.0mm■ |
| BGA Pitch | 400μm | 300μm |
| Function | Daisy Chain | Daisy Chain |
| Electrode | Ball Mounted Solder Bump | Ball Mounted Solder Bump |
| Pad Size | (φ227µm●) | (φ177µm●) |
| Number of Pad | 144 pins/chip | 264 pins/chip |
| Number of Chip | 712 chips/wafer | 712 chips/wafer |
| Specification | TEG0306 | TEG0408 | TEG0510 |
|---|---|---|---|
| Wafer Size | φ 8 inch | φ 8 inch | φ 8 inch |
| Wafer Thickness | 400μm | 400μm | 400μm |
| Cut Size (Min.) | 600μm■ | 800μm■ | 1000μm■ |
| Pad Pitch | 300μm | 400μm | 500μm |
| Function | Daisy Chain | Daisy Chain | Daisy Chain |
| Electrode | Ball Mounted Solder Bump | Ball Mounted Solder Bump | Ball Mounted Solder Bump |
| Post Size | 175μm | 200μm | 250μm |
| Number of Chip | 79257 chips/wafer | 44161 chips/wafer | 28212 chips/wafer |
| Specification | WALTS-TEG MC03-0101JY | ||
|---|---|---|---|
| Wafer Size | φ 8 inch | ||
| Wafer Thickness | 725μm±25μm | ||
| Chip Size | 0.3mm■ | 0.4mm■ | 0.5mm■ |
| Pad Pitch | 120μm | 220μm | 320μm |
| Function | Daisy Chain | Daisy Chain | Daisy Chain |
| Pad Metal Size | X: 65μm Y: 170μm |
X: 65μm Y: 270μm |
X: 65μm Y: 370μm |
| Bump Size | 40μm | ||
| Bump Height | Au(10μm) | ||
| Number of Chip | 149,216 chips/wafer |
80,816 chips/wafer |
26,604 chips/wafer |
| Evaluation KIT | --- |
||
| Specification | WALTS-TEG ME0102JY | |||||
|---|---|---|---|---|---|---|
| Wafer Size | φ 12 inch | |||||
| Chip Size | 20mm×25mm | |||||
| Chip Name | Chip_10_15 | Chip_20_25 | Chip_30_35 | |||
| Metal Height | 5.5μm | |||||
| Facing Legth | 3mm | |||||
| Line/Space | 15μm/10μm | 15μm/15μm | 15μm/20μm | 15μm/25μm | 15μm/30μm | 15μm/35μm |
| Pitch | 25μm | 30μm | 35μm | 40μm | 45μm | 50μm |
| Number of Chip | 34 chips/wafer | 40 chips/wafer | 34 chips/wafer | |||
| Specification | STAC-0101JY |
|---|---|
| Wafer Size | φ 6 inch(Orientation Flat) |
| Wafer Thickness | 550±25μm |
| Chip Size | 3.0mm■ |
| Pad Pitch | 300μm |
| Function | Stress Analysis by Piezoresistance Thermal Analysis by Diode Heat Generarion by Resistance |
| Electrode | (Al Pad, Cu Pillar Bump, Solder Bump, Au Bump) |
| Number of Pad | 32 pads/chip |
| Number of Chip | 1596 chips/wafer |
| Polyimide (Option) | ○ |
| <Option> | Back Side Metallization |
| Evaluation KIT | WALTS-KIT STAC-0201JY |
| Specification | STACTEG-150FA |
STACTEG-300FA |
|---|---|---|
| ※Base Wafer:WALTS-TEG STAC-0101JY | ||
| Wafer Size | φ 6 inch (Orientation Flat) | φ 6 inch (Orientation Flat) |
| Wafer Thickness | 550±25μm | 550±25μm |
| Chip Size | 3.0mm■ | 3.0mm■ |
| Pad Pitch | 150μm | 300μm |
| Function | Stress Analysis by Piezoresistance Thermal Analysis by Diode Heat Generarion by Resistance |
Stress Analysis by Piezoresistance Thermal Analysis by Diode Heat Generarion by Resistance |
| Bump Size | φ110µm● | φ110µm● |
| Bump Height | (Ni5μm+SnAg75µm) | (Cu50μm+SnAg10μm) |
| Number of Pad | 32 pads/chip | 32 pads/chip |
| Number of Bump | 32 bumps + 253 Dummy bumps | 32 bumps + 64 Dummy bumps |
| Number of Chip | 1596 chips/wafer | 1596 chips/wafer |
| Polyimide (Option) | ○ | ○ |
| <Option> | Back Side Metallization | Back Side Metallization |
| Evaluation KIT | WALTS-KIT STAC-0201JY |
|
| Specification | HPW-0101JY |
|---|---|
| Wafer Size | φ 8 inch(Notch) |
| Wafer Thickness | 725±25μm |
| Chip Size | 3.0mm■ |
| Pad Pitch | 300μm |
| Function | Thermal Analysis by Diode Heat Generarion by Resistance |
| Electrode | (Al Pad, Cu Pillar Bump, Solder Bump, Au Bump) |
| Number of Pad | 32 pads/chip |
| Number of Chip | 2964 chips/wafer |
| Polyimide (Option) | ○ |
| <Maximum Output> | Max. 14.5W/Chip |
| <Option> | Back Side Metallization |
| Specification | HPWTEG-150FA |
HPWTEG-300FA |
|---|---|---|
| ※Base Wafer:WALTS-TEG HPW-0101JY | ||
| Wafer Size | φ 8 inch(Notch) | φ 8 inch(Notch) |
| Wafer Thickness | 725±25μm | 725±25μm |
| Chip Size | 3.0mm■ | 3.0mm■ |
| Pad Pitch | 150μm | 300μm |
| Function | Thermal Analysis by Diode Heat Generarion by Resistance |
Thermal Analysis by Diode Heat Generarion by Resistance |
| Bump Size | φ110µm● | φ110µm● |
| Bump Height | (Ni5μm+SnAg75µm) | (Cu50μm+SnAg10μm) |
| Number of Pad | 32 pads/chip | 32 pads/chip |
| Number of Bump | 32 bumps + 253 Dummy bumps |
32 bumps + 64 Dummy bumps |
| Number of Chip | 2964 chips/wafer | 2964 chips/wafer |
| <Option> | Back Side Metallization | Back Side Metallization |
| Evaluation KIT | --- |
|
| Specification | HPW TSV-0101JY ※Base Wafer:WALTS-TEG HPW-0101JY(SiN) |
|||
|---|---|---|---|---|
| Wafer Size | φ 8 inch(Notch) | |||
| Wafer Thickness | 100μm | |||
| Chip Size | 3.0mm■ | |||
| Top Side |
Electrode | Cu Pillar | ||
| Bump Pitch | 300μm | |||
| Bump Size | φ100μm● | |||
| Bump Height | (Cu50μm+SnAg10μm) |
|||
| Number of Bump | 32 bumps + 64 Dummy bumps |
|||
| TSV | Via Size | φ90μm● | ||
| Bottom Side |
Electrode | Electroless Ni/Au Plating | ||
| Bump Pitch | 300μm | |||
| Bump Size | φ100μm● | |||
| Bump Height | (8μm) |
|||
| Number of Bump | 32 bumps |
|||
| Number of Chip | 2964 chips/wafer | |||
| Evaluation KIT | --- | |||
| Specification | Type-A | Type-B | Type-C |
|---|---|---|---|
| Wafer Size | φ 5 inch | φ 5 inch | φ 5 inch |
| Wafer Thickness | 625μm | 625μm | 625μm |
| Chip Size | 3.2mm■ | 1.6mm■ | 0.8mm■ |
| Pad Pitch | any | any | any |
| Function | Fever resistance | Fever resistance | Fever resistance |
| Bump Size | - | - | - |
| Bump Height | - | - | - |
| Number of Pad | 20 pads/chip | 12 pads/chip | 8 pads/chip |
| Number of Chip | 655 chips/wafer | 974 chips/wafer | 1272 chips/wafer |
| Polyimide (Option) | ○ | ○ | ○ |
| Evaluation KIT | --- |
||
| Specification | LKWB120 |
|---|---|
| Wafer Size | φ 12 inch |
| Wafer Thickness | 775±25μm |
| Chip Size | 10.0 mm■ |
| Pad Pitch | 120 μm Staggered |
| Function | Daisy Chian,Comb tooth Capacitor,Serpentine Resistor,Interlayer Capacitor,Via Chain |
| Bump Size | - |
| Bump Height | - |
| Number of Pad | 616 pads/chip |
| Number of Chip | 636 chips/wafer |
| Polyimide (Option) | ○ |
| Evaluation KIT | WALTS-KIT LKWB120 |
| Specification | LCD30-0101JY |
|---|---|
| Wafer Size | φ 6 inch |
| Wafer Thickness | 550±25μm |
| Chip Size | 15.1 mm × 1.6 mm |
| Pad Pitch | 30μm |
| Function | Daisy Chian |
| Bump Size | 20µm×100µm |
| Bump Height | any |
| Number of Pad | 726 pads/chip |
| Number of Chip | 530 chips/wafer |
| Polyimide (Option) | ○ |
| Evaluation KIT | WALTS-KIT LCD30_ITO WALTS-KIT COF30 |
| Specification | PWB0101JY |
|---|---|
| Wafer Size | φ 6 inch |
| Wafer Thickness | 625±25μm |
| Chip Size | 6.0mm■ |
| Pad Pitch | - |
| Function | Bondability Check |
| Bump Size | - |
| Bump Height | - |
| Number of Pad | - |
| Number of Chip | - |
| Polyimide (Option) | --- |
| Evaluation KIT | --- |